ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,625, issued on Sept. 22, was assigned to K&M Shooting Products LLC (Holland, Mich.). "Case length trimmer (CLT) with micro-adjustment tool... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,626, issued on Sept. 22. "Precision stylus control system" was invented by Kurt Rubin (Santa Clara, Calif.), Chris Persico (Simi Valley, C... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,627, issued on Sept. 22, was assigned to Halliburton Energy Services Inc. (Houston). "Capacitative sensing device for in-situ monitoring o... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,628, issued on Sept. 22, was assigned to Hangzhou Dianzi University (Hangzhou, China). "Device and method for measuring rotation angle of ... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,629, issued on Sept. 22, was assigned to FURUKAWA ELECTRIC Co. LTD. (Tokyo). "Optical coherence tomograph" was invented by Noritaka Matsub... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,630, issued on Sept. 22, was assigned to Korea Advanced Institute of Science and Technology (Daejeon, South Korea). "System and method for... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,632, issued on Sept. 22, was assigned to NANJING KINGYOUNG INTELLIGENT SCIENCE & TECHNOLOGY Co.LTD (Nanjing, China). "Method and system fo... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,633, issued on Sept. 22, was assigned to VOLVO TRUCK Corp. (Gothenburg, Sweden). "Optimising vehicle measurements" was invented by Helena ... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,634, issued on Sept. 22, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY(HONG KONG) Ltd. (Hong Kong). "Dimension measurement apparatus" wa... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,635, issued on Sept. 22, was assigned to MONSTR SENSE TECHNOLOGIES LLC (Ann Arbor, Mich.). "Layer thickness determination by four-wave-mix... Read More